Dr. Rajender Singh currently serves as a scientific officer in the Electron Microscopy Section at the Department of CIL/SAIF, Panjab University, Chandigarh, India. With nearly 13 years of experience in the field of electron microscopy, Dr. Singh is a seasoned expert in many facets of TEM sample preparation. His role involves analyzing diverse samples from material science and life science areas across India, utilizing cutting-edge instruments such as TEM (H7500, 120KV), HRTEM with SAED, EDS (Oxford), and FESEM with EDS (Hitachi SU8010). Dr. Singh is not only responsible for the operation of sophisticated instruments but also leads training modules for students at various academic levels, focusing on TEM, HRTEM, SEM, FESEM, ultramicrotome, and Critical Point Dryer (CPD) instruments.
His technical skills span handling HRTEM JEOL 2100 Plus independently, performing maintenance for various TEM models, and interpreting STEM bright field and dark field imaging.